Charakterisierung &
Rasterkraftmikroskopie

Dimension 3100 (NanoScope IV, Veeco Inc.) Dimension 3100 NanoScope IV
Kontakt: Markus Hund,
This scanning force microscope (SFM) is equipped with a Nanoscope IV controller and a closed-loop XY tip-scanner (1024 x 1024 pixels). NanoScript software enables to develop user-specific software e.... more...

Universität Bayreuth -